Description

SciAps X-200 XRF Analyzer: A Game-Changer in Material Analysis

Overview of the SciAps X-200 XRF Analyzer

The SciAps X-200 XRF Analyzer delivers exceptional speed and performance, comparable or superior to top-tier analyzers from other brands. This device integrates a top-performing SDD (Silicon Drift Detector) similar to the X-300 model, paired with a standard pulse processing electronics version. The X-200 features the same highly optimized X-ray tube and detector geometry as the X-300, ensuring superior analytical performance.

Its compact and lightweight design, coupled with fast performance across all alloy families—including aluminum—makes it a preferred choice for scrap processing and non-destructive testing. The device also excels in geochemical applications, supporting environmental, exploration, and mining tests with slightly higher limits of detection (LODs) compared to the X-300.

Additionally, the SciAps Empirical App enables users to test various materials and create customized calibration models. Factory calibration options include fundamental parameters, Compton Normalization (EPA Method 6200), and user-defined empirical calibrations.

Key Features & Specifications

Physical Characteristics:

• Weight: 3.3 lbs with battery
• Dimensions: 7.25″ x 10.5″ x 4.5″
• Power: Onboard rechargeable Li-ion battery (hot-swap capable within 60 seconds) or AC power
• Display: 5″ color touchscreen with PowerVR SGX540 3D graphics
• Connectivity: Wi-Fi, Bluetooth, USB for data transfer, compatible with SciAps Profile Builder PC software

Analytical Performance:

• Excitation Source: 6-40kV, 200µA Rh anode for alloy testing; 6-50kV, 200µA Au anode for other applications
• Detector: 20mm² silicon drift detector with 135eV resolution at 5.95Mn K-alpha line
• X-Ray Filtering: 6-position filter wheel for optimized beam performance

Processing Electronics:

• Host Processor: ARM Cortex-A9 dual-core 1.2GHz
• Memory: 1GB DDR2 RAM, 1GB NAND
• Results Storage: 8GB SD card
• Pulse Processor: 14-bit ADC with 80 MSPS digitization rate

Calibration and Validation:

• Calibration: Fundamental parameters, Compton Normalization for geochemical/environmental soil apps, or empirical calibrations
• Calibration Check: Automated using the 316 stainless steel internal shutter

Environmental and Compliance:

• Operating Temperature Range: 10°F to 130°F at 25% duty cycle
• Regulatory Compliance: CE, RoHS, USFDA registered, Canada RED Act

Package Inclusions

When you purchase the SciAps X-200 XRF Analyzer, the package includes:

• SciAps X-200 Analyzer Gun
• 2 rechargeable Li-ion batteries
• Charger and USB cable
• Standard Profile Builder software for data management
• Wrist strap and waterproof carrying case
• Factory start-up training and support
• Lifetime free software upgrades
• Spare prolene windows
• Warranty card and calibration certificate

Why Choose the SciAps X-200 XRF Analyzer?

The SciAps X-200 XRF Analyzer is designed for professionals requiring a reliable, high-performing tool for material analysis. Its lightweight, portable design ensures ease of use, while advanced technology delivers precise results for industries like scrap processing, geochemistry, and environmental testing. The built-in SciAps Empirical App further enhances its flexibility, allowing users to develop custom calibration models for unique applications.

Warranty Information

The SciAps X-200 comes with a 1-year warranty, ensuring peace of mind and reliable post-purchase support. Additionally, free lifetime software upgrades are included, keeping your device up-to-date with the latest features.